Mahesh Enumula, Dr. M. Giri, and Dr. V. K. Sharma , trans. “A New Efficient Forgery Detection Method Using Scaling, Binning, Noise Measuring Techniques and Artificial Intelligence (Ai)”. International Journal of Innovative Technology and Exploring Engineering (IJITEE) 12, no. 9 (August 30, 2023): 17–21. Accessed November 21, 2024. https://journals.blueeyesintelligence.org/index.php/ijitee/article/view/107.