A Comprehensive Study on Failure Modes and Mechanisms of Thin Film Chip Resistors. International Journal of Engineering and Advanced Technology (IJEAT), [S. l.], v. 13, n. 3, p. 7–13, 2024. DOI: 10.35940/ijeat.C4355.13020224. Disponível em: https://journals.blueeyesintelligence.org/index.php/ijeat/article/view/267.. Acesso em: 24 nov. 2024.