Dr. Sarat Kumar Dash and Sandhya V. Kamattrans. 2024. A Comprehensive Study on Failure Modes and Mechanisms of Thin Film Chip Resistors. International Journal of Engineering and Advanced Technology (IJEAT). 13, 3 (Feb. 2024), 7–13. DOI:https://doi.org/10.35940/ijeat.C4355.13020224.